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Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.

C. MukherjeeThomas JacquetAnjan ChakravortyThomas ZimmerJosef BockKlaus AufingerCristell Maneux
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • reliability analysis
  • service oriented architecture
  • signal to noise ratio
  • service oriented
  • web services
  • business process
  • fault tree
  • case study
  • management system
  • fault diagnosis
  • thin film