Login / Signup
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
C. Mukherjee
Sébastien Fregonese
Thomas Zimmer
Cristell Maneux
Henri Happy
David Mele
Published in:
ESSDERC (2014)
Keyphrases
</>
thin film
chemical vapor deposition
room temperature
film thickness
high density
surface temperature
measurement noise
multi layer
optical properties
data sets
measured data
high temperature
neural network
expert systems
control system
solar radiation