Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.

Sébastien Fregonese Chhandak Mukherjee Holger Rücker Pascal Chevalier Gerhard Fischer Didier Céli Marina Deng Marine Couret François Marc Cristell Maneux Thomas Zimmer

Published in: BCICTS (2021)

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