On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Brice GrandchampCristell ManeuxNathalie LabatAndré TouboulThomas ZimmerPublished in: Microelectron. Reliab. (2004)
Keyphrases
- low frequency
- high frequency
- frequency domain
- electromagnetic fields
- wavelet transform
- measurement noise
- random noise
- wavelet analysis
- noise reduction
- high frequency components
- discrete wavelet transform
- signal to noise ratio
- wavelet coefficients
- image compression
- machine learning
- gaussian noise
- dct domain
- original images
- subband
- video sequences
- image processing