Vincenzo d'Alessandro

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 12

Top Topics

Power Transmission

Gallium Arsenide

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Ciro Scognamillo, Antonio Pio Catalano, Lorenzo Codecasa, Alberto Castellazzi, Vincenzo d'Alessandro
Enhancing Electrical Ruggedness in Double-Sided Cooled Power Modules. PRIME (2024)
Ciro Scognamillo, Antonio Pio Catalano, Vincenzo d'Alessandro, Peter J. Zampardi, Kerry Burger
Improving Performance of InGaP/GaAs HBT Arrays by means of Temperature-Dependent Base Ballasting Resistors. PRIME (2023)
Mahmoud Dhimish, Vincenzo d'Alessandro, Santolo Daliento
Investigating the Impact of Cracks on Solar Cells Performance: Analysis Based on Nonuniform and Uniform Crack Distributions. IEEE Trans. Ind. Informatics 18 (3) (2022)
Ciro Scognamillo, Antonio Pio Catalano, Vincenzo d'Alessandro, Lorenzo Codecasa, Alberto Castellazzi
Defect Detection in Double-Sided Cooled Power Modules by Structure Functions. PRIME (2022)
Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources. Microelectron. Reliab. 87 (2018)
Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization. Microelectron. Reliab. 87 (2018)
Antonio Pio Catalano, Michele Riccio, Lorenzo Codecasa, Alessandro Magnani, G. Romano, Vincenzo d'Alessandro, Luca Maresca, Nils Rinaldi, Giovanni Breglio, Andrea Irace
Model-Order Reduction Procedure for Fast Dynamic Electrothermal Simulation of Power Converters. ApplePies (2017)
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi, Andre G. Metzger, Robin Bornoff, John Parry
Partition-based approach to parametric dynamic compact thermal modeling. Microelectron. Reliab. 79 (2017)
Vincenzo d'Alessandro, Antonio Pio Catalano, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Brian Moser, Peter J. Zampardi
Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies. Microelectron. Reliab. 78 (2017)
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
3-D thermal models calibration by parametric dynamic compact thermal models. Microelectron. Reliab. 79 (2017)
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Bock, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. Proc. IEEE 105 (6) (2017)
Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger
Advanced thermal simulation of SiGe: C HBTs including back-end-of-line. Microelectron. Reliab. 67 (2016)
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55 (9-10) (2015)
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
Structure-preserving approach to multi-port dynamic compact models of nonlinear heat conduction. Microelectron. J. 46 (12) (2015)
Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy
3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. Microelectron. Reliab. 54 (9-10) (2014)
Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi, Massimiliano de Magistris, Klaus Aufinger
Dynamic electrothermal macromodeling techniques for thermal-aware design of circuits and systems. PATMOS (2013)
Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. Microelectron. Reliab. 53 (9-11) (2013)
Andre G. Metzger, Vincenzo d'Alessandro, Niccolò Rinaldi, Peter J. Zampardi
Evaluation of thermal balancing techniques in InGaP/GaAs HBT power arrays for wireless handset power amplifiers. Microelectron. Reliab. 53 (9-11) (2013)
Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Jaume Roig, David Flores, Peter Moens
Influence of charge balance on the robustness of trench-based super junction diodes. Microelectron. Reliab. 52 (9-10) (2012)
Nebojsa Nenadovic, Slobodan Mijalkovic, Lis K. Nanver, Lode K. J. Vandamme, Vincenzo d'Alessandro, Hugo Schellevis, Jan W. Slotboom
Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors. IEEE J. Solid State Circuits 39 (10) (2004)