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Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations.

Vincenzo d'AlessandroAlessandro MagnaniMichele RiccioYohei IwahashiGiovanni BreglioNiccolò RinaldiAndrea Irace
Published in: Microelectron. Reliab. (2013)
Keyphrases
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