Piet Vanmeerbeek

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 1

Top Topics

Text Extraction

Document Layout

Silicon Dioxide

Energy Dissipation

Top Venues

Publications

Davide Favero, Carlo De Santi, Arno Stockman, Arianna Nardo, Piet Vanmeerbeek, Marnix Tack, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout. IRPS (2024)
Peter Moens, Abhishek Banerjee, P. Coppens, A. Constant, Piet Vanmeerbeek, Z. Li, F. Declercq, L. De Schepper, H. De Vleeschouwer, C. Liu, B. Padmanabhan, W. Jeon, J. Guo, A. Salih, Marnix Tack
Technology and design of GaN power devices. ESSDERC (2015)
Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni, Piet Vanmeerbeek, Peter Moens
Trapping induced parasitic effects in GaN-HEMT for power switching applications. ICICDT (2015)
Matteo Meneghini, Riccardo Silvestri, Stefano Dalcanale, Davide Bisi, Enrico Zanoni, Gaudenzio Meneghesso, Piet Vanmeerbeek, Abhishek Banerjee, Peter Moens
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors. IRPS (2015)
Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Jaume Roig, David Flores, Peter Moens
Influence of charge balance on the robustness of trench-based super junction diodes. Microelectron. Reliab. 52 (9-10) (2012)
Ana Villamor-Baliarda, Piet Vanmeerbeek, Jaume Roig, Peter Moens, David Flores
Electric field unbalance for robust floating ring termination. Microelectron. Reliab. 51 (9-11) (2011)
R. Charavel, Jaume Roig, S. Mouhoubi, P. Gassot, Filip Bauwens, Piet Vanmeerbeek, B. Desoete, Peter Moens, Eddy De Backer
Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. Microelectron. Reliab. 50 (9-11) (2010)
R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47 (9-11) (2007)