G. Lekens

Publication Activity (10 Years)

Years Active: 2003-2007
Publications (10 Years): 0

Publications

R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47 (9-11) (2007)
H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45 (9-11) (2005)
Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43 (9-11) (2003)