Ward De Ceuninck

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 2

Top Topics

Surface Fitting

Automatic Detection

Infrared Sensors

Modular Structure

Top Venues

Publications

Philippe Nivelle, Tom Borgers, Eszter Voroshazi, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen
Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules. IRPS (2018)
Thijs Vandenryt, Bart van Grinsven, Kasper Eersels, Peter Cornelis, Safira Kholwadia, Thomas Cleij, Ronald Thoelen, Ward De Ceuninck, Marloes Peeters, Patrick Wagner
Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic Receptors. Sensors 17 (12) (2017)
Gideon Wackers, Thijs Vandenryt, Peter Cornelis, Evelien Kellens, Ronald Thoelen, Ward De Ceuninck, Patricia Losada-Pérez, Bart van Grinsven, Marloes Peeters, Patrick Wagner
Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted Polymers. Sensors 14 (6) (2014)
Thijs Vandenryt, Andrea Pohl, Bart van Grinsven, Ronald Thoelen, Ward De Ceuninck, Patrick Wagner, Jörg Opitz
Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface Interactions. Sensors 13 (11) (2013)
Bram Geerets, Marloes Peeters, Bart van Grinsven, Karolien Bers, Ward De Ceuninck, Patrick Wagner
Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection Limits. Sensors 13 (7) (2013)
Jeroen Broeders, Dieter Croux, Ans Weustenraed, Thomas Cleij, Patrick Wagner, Ward De Ceuninck, Wouter Vanaken, Stijn Duchateau, Ronald Thoelen
Embedded Unit for Point-of-Care Impedance Based Biosensor Readout. HPCC-ICESS (2012)
R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47 (9-11) (2007)
Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45 (3-4) (2005)
Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44 (9-11) (2004)
Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44 (9-11) (2004)
Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43 (9-11) (2003)
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43 (9-11) (2003)
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42 (9-11) (2002)
Luc Tielemans, R. Rongen, Ward De Ceuninck
How reliable are reliability tests? Microelectron. Reliab. 42 (9-11) (2002)
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
at ultra low voltages. Microelectron. Reliab. 42 (9-11) (2002)
R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectron. Reliab. 42 (9-11) (2002)
Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41 (9-10) (2001)
R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41 (3) (2001)
R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. Microelectron. Reliab. 41 (9-10) (2001)