Stefano Aresu

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 1

Top Topics

Transmission Electron Microscopy

Electrical Properties

Leakage Current

Top Venues

Microelectron. Reliab.

Publications

Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. IMW (2023)
C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski
HCS degradation of 5 nm oxide high-voltage PLDMOS. Microelectron. Reliab. 54 (9-10) (2014)
Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48 (8-9) (2008)
Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47 (9-11) (2007)
Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectron. Reliab. 47 (9-11) (2007)
Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44 (9-11) (2004)
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43 (9-11) (2003)
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
at ultra low voltages. Microelectron. Reliab. 42 (9-11) (2002)