Reinhard Pufall

Publication Activity (10 Years)

Years Active: 2004-2014
Publications (10 Years): 0

Top Topics

Evaluation Criteria

Electronic Devices

Watershed Algorithm

Top Venues

Microelectron. Reliab.

Publications

Georg Michael Reuther, Reinhard Pufall, Michael Goroll
Acoustic detection of micro-cracks in small electronic devices. Microelectron. Reliab. 54 (9-10) (2014)
Michael Goroll, Reinhard Pufall
Determination of adhesion and delamination prediction for semiconductor packages by using Grey Scale Correlation and Cohesive Zone Modelling. Microelectron. Reliab. 52 (9-10) (2012)
Rainer Dudek, Reinhard Pufall, Bettina Seiler, Bernd Michel
Studies on the reliability of power packages based on strength and fracture criteria. Microelectron. Reliab. 52 (7) (2012)
Reinhard Pufall, Michael Goroll, Joachim Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests. Microelectron. Reliab. 52 (7) (2012)
Michael Goroll, Reinhard Pufall
New aspects in characterization of adhesion of moulding compounds on different surfaces by using a simple button-shear-test method for lifetime prediction of power devices. Microelectron. Reliab. 50 (9-11) (2010)
Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectron. Reliab. 48 (8-9) (2008)
Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectron. Reliab. 47 (9-11) (2007)
Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectron. Reliab. 47 (9-11) (2007)
Michael Goroll, Werner Kanert, Reinhard Pufall
ESD protection structure qualification - a new approach for release for automotive applications. Microelectron. Reliab. 46 (9-11) (2006)
Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat
Semiconductors in high temperature applications - a future trend in automotive industry. Microelectron. Reliab. 44 (9-11) (2004)