Wolfgang Gustin

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 7

Top Topics

Electrical Properties

Image Degradation

Positively Correlated

Top Venues

Microelectron. Reliab.

Publications

Tibor Grasser, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Dominic Waldhör, A. Vasilev, Michael Waltl, Thomas Aichinger, M. Bockstedte, Wolfgang Gustin, Gregor Pobegen
A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs. IRPS (2024)
Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser
Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs. IRPS (2023)
Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser
Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs. IRPS (2022)
Christian Schlünder, Katja Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectron. Reliab. 82 (2018)
Katja Puschkarsky, Hans Reisinger, Christian Schlünder, Wolfgang Gustin, Tibor Grasser
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI. ESSDERC (2018)
Katja Puschkarsky, Tibor Grasser, Thomas Aichinger, Wolfgang Gustin, Hans Reisinger
Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs. IRPS (2018)
Christian Schlünder, Jörg Berthold, Fabian Proebster, Andreas Martin, Wolfgang Gustin, Hans Reisinger
Degradation and recovery of variability due to BTI. Microelectron. Reliab. 64 (2016)
C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski
HCS degradation of 5 nm oxide high-voltage PLDMOS. Microelectron. Reliab. 54 (9-10) (2014)
Gunnar Andreas Rott, Karina Rott, Hans Reisinger, Wolfgang Gustin, Tibor Grasser
Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors. Microelectron. Reliab. 54 (9-10) (2014)
Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectron. Reliab. 48 (8-9) (2008)
Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectron. Reliab. 45 (1) (2005)