IMAGE DEGRADATION
Experts
- Huib de Ridder
- Ankan Bhattacharya
- Kazuki Endo
- Sarbani Palit
- Masatoshi Okutomi
- Masayuki Tanaka
- Alan C. Bovik
- Damon M. Chandler
- Leida Li
- Piet Wambacq
- Fahim Faisal Niloy
- Tianxiang Hu
- Cyril Höschl IV
- Yang Feng
- Marc Pollefeys
- Azeddine Beghdadi
- Jan Flusser
- Bhavya Goyal
- Wanghui Ding
- Otmar Hilliges
- Miika Aittala
- Tieniu Tan
- Thierry Trémas
- Sajad Farokhi
- Vitali V. Gavrik
- Peyman Milanfar
- Jaakko Lehtinen
- Stéphane Donnay
- Jie Song
- Jiaxiang Liu
- Tero Karras
- Jürgen Jung
- Elsayed A. Elsayed
- Geert Van der Plas
- Richard J. Vaccaro
- Fu Li
- Kenneth C. Young
- Simon S. Woo
- Zhenan Sun
Venues
- CoRR
- PICS
- IQSP
- Human Vision and Electronic Imaging
- J. Digit. Imaging
- Color Imaging Conference
- Remote. Sens.
- ICASSP
- CVPR
- IEEE Access
- Microelectron. Reliab.
- ICIP
- EMBC
- IEEE Trans. Image Process.
- IET Image Process.
- EUSIPCO
- IEEE Trans. Instrum. Meas.
- IGARSS
- Sensors
- SMC
- ICIP (1)
- J. Electronic Imaging
- IEEE Trans. Reliab.
- IEEE Geosci. Remote. Sens. Lett.
- Multim. Tools Appl.
- ICIP (2)
- NeuroImage
- Digital Mammography / IWDM
- Medical Imaging: Image Processing
- IEICE Trans. Electron.
- CCECE
- IEEE Trans. Acoust. Speech Signal Process.
- VISAPP (1)
- MMSP
- IEEE Trans. Geosci. Remote. Sens.
- ICIP (3)
- CVPR Workshops
- ICB
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
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