IMAGE DEGRADATION
Experts
- Huib de Ridder
- Kazuki Endo
- Masatoshi Okutomi
- Masayuki Tanaka
- Sarbani Palit
- Ankan Bhattacharya
- Alan C. Bovik
- Leida Li
- Damon M. Chandler
- William Kress
- Yin Li
- Yiming Zhao
- Bhavya Goyal
- Simon S. Woo
- Sajad Farokhi
- Samuli Laine
- Geert Van der Plas
- Charlotte Soens
- Miika Aittala
- Jie Song
- Fu Li
- Ole Norberg
- Wanghui Ding
- Marc Pollefeys
- Michael E. Miller
- Jaakko Lehtinen
- Janne Hellsten
- Stéphane Donnay
- Elsayed A. Elsayed
- Jürgen Jung
- Sanghoon Lee
- Tianxiang Hu
- Thierry Trémas
- Anil K. Jain
- Sophie Triantaphillidou
- Ziyi Wang
- Aladine Chetouani
- Zhenan Sun
- Timotheus J. W. M. Janssen
Venues
- CoRR
- PICS
- IQSP
- Human Vision and Electronic Imaging
- J. Digit. Imaging
- Color Imaging Conference
- CVPR
- ICASSP
- Remote. Sens.
- Microelectron. Reliab.
- IET Image Process.
- EMBC
- ICIP
- IEEE Access
- IEEE Trans. Image Process.
- IGARSS
- Sensors
- EUSIPCO
- IEEE Trans. Instrum. Meas.
- NeuroImage
- ICIP (2)
- IEEE Geosci. Remote. Sens. Lett.
- Digital Mammography / IWDM
- Multim. Tools Appl.
- IEEE Trans. Reliab.
- SMC
- J. Electronic Imaging
- ICIP (1)
- Medical Imaging: Image Processing
- ISCAS
- J. Vis. Commun. Image Represent.
- ICB
- Symmetry
- VISAPP (1)
- Pattern Recognit. Lett.
- CVPR Workshops
- MMSP
- IEICE Trans. Electron.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
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