Christian Schlünder

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 6

Top Topics

Uniformly Distributed

Signature Verification

Software Product Line

Top Venues

Microelectron. Reliab.

Publications

Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. IRPS (2023)
Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. IRPS (2022)
Christian Schlünder, Katja Waschneck, Peter Rotter, Susanne Lachenmann, Hans Reisinger, Franz Ungar, Georg Georgakos
From Device Aging Physics to Automated Circuit Reliability Sign Off. IRPS (2019)
Christian Schlünder, Katja Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectron. Reliab. 82 (2018)
Katja Puschkarsky, Hans Reisinger, Christian Schlünder, Wolfgang Gustin, Tibor Grasser
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI. ESSDERC (2018)
Christian Schlünder, Jörg Berthold, Fabian Proebster, Andreas Martin, Wolfgang Gustin, Hans Reisinger
Degradation and recovery of variability due to BTI. Microelectron. Reliab. 64 (2016)
Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider
Practical aspects of reliability analysis for IC designs. DAC (2006)
Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectron. Reliab. 45 (1) (2005)