Login / Signup
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits.
Christian Schlünder
Ralf Brederlow
Benno Ankele
Wolfgang Gustin
Karl Goser
Roland Thewes
Published in:
Microelectron. Reliab. (2005)
Keyphrases
</>
signal to noise ratio
analog vlsi
analog circuits
circuit design
floating gate
multi channel
digital circuits
mixed signal
positive and negative
high speed
markov chain
low voltage
field effect transistors
focal plane
logic synthesis
multiple access
radio frequency
signal processing