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From Device Aging Physics to Automated Circuit Reliability Sign Off.

Christian SchlünderKatja WaschneckPeter RotterSusanne LachenmannHans ReisingerFranz UngarGeorg Georgakos
Published in: IRPS (2019)
Keyphrases
  • software aging
  • semiconductor devices
  • artificial intelligence
  • high speed
  • semi automated
  • semi automatic
  • fully automated
  • digital circuits
  • age estimation
  • neural network
  • genetic algorithm
  • computer science