NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification.
Christian SchlünderKatja PuschkarskyGunnar Andreas RottWolfgang GustinHans ReisingerPublished in: Microelectron. Reliab. (2018)
Keyphrases
- asynchronous circuits
- high speed
- model checking
- real world
- circuit design
- electronic circuits
- delay insensitive
- face verification
- analog vlsi
- simulation environment
- analog circuits
- digital circuits
- physical objects
- physical systems
- feature extraction
- verification method
- low cost
- age estimation
- numerical simulations
- formal verification
- signature verification
- data sets
- mathematical analysis
- low power
- simulation model