Thomas Pompl

Publication Activity (10 Years)

Years Active: 2005-2009
Publications (10 Years): 0

Publications

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix
Reliability aspects of gate oxide under ESD pulse stress. Microelectron. Reliab. 49 (12) (2009)
Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider
Practical aspects of reliability analysis for IC designs. DAC (2006)
Thomas Pompl, Michael Röhner
Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics. Microelectron. Reliab. 45 (12) (2005)