Harald Gossner

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 3

Top Topics

Cmos Technology

Design Automation

Electrical Engineering

Top Venues

Microelectron. Reliab.

Publications

Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS (2018)
Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSI Design (2017)
Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSI Design (2016)
Harald Gossner, Charvaka Duvvury
System efficient ESD design. Microelectron. Reliab. 55 (12) (2015)
Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton
Electronic design automation (EDA) solutions for ESD-robust design and verification. CICC (2012)
Harald Gossner, Werner Simbürger, Matthias Stecher
System ESD robustness by co-design of on-chip and on-board protection measures. Microelectron. Reliab. 50 (9-11) (2010)
Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner
Do ESD fails in systems correlate with IC ESD robustness? Microelectron. Reliab. 49 (9-11) (2009)
Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix
Reliability aspects of gate oxide under ESD pulse stress. Microelectron. Reliab. 49 (12) (2009)
Wolfgang Soldner, Moon-Jung Kim, Martin Streibl, Harald Gossner, Thomas H. Lee, Doris Schmitt-Landsiedel
A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection. ISSCC (2007)
Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton
RF ESD protection strategies: Codesign vs. low-C protection. Microelectron. Reliab. 47 (7) (2007)
Moon-Jung Kim, Henrik Icking, Harald Gossner, Thomas H. Lee
High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications. CICC (2007)
Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer
Circuit design issues in multi-gate FET CMOS technologies. ISSCC (2006)
Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. Microelectron. Reliab. 45 (9-11) (2005)
Martin Streibl, F. Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel
High abstraction level permutational ESD concept analysis. Microelectron. Reliab. 45 (2) (2005)
Harald Gossner
ESD protection for the deep sub micron regime - a challenge for design methodology. VLSI Design (2004)
Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectron. Reliab. 43 (7) (2003)
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectron. Reliab. 42 (9-11) (2002)
F. Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann
Case study of a technology transfer causing ESD problems. Microelectron. Reliab. 42 (9-11) (2002)
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectron. Reliab. 41 (9-10) (2001)
Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectron. Reliab. 41 (3) (2001)
Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner
Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. Microelectron. Reliab. 41 (11) (2001)