Gianluca Boselli

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 9

Top Topics

Cellular Automaton

Scalability Issues

Top Venues

Microelectron. Reliab.

Publications

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. IRPS (2023)
Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection. IRPS (2023)
Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli
TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells. IRPS (2022)
M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. IRPS (2022)
Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. IRPS (2020)
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS (2020)
Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. IRPS (2019)
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. IRPS (2019)
Akram A. Salman, Farzan Farbiz, Ann Concannon, Hal Edwards, Gianluca Boselli
Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique. Microelectron. Reliab. 57 (2016)
Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton
Electronic design automation (EDA) solutions for ESD-robust design and verification. CICC (2012)
Gianluca Boselli
ESD design challenges in state-of-the-art analog technologies. Microelectron. Reliab. 52 (9-10) (2012)
Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46 (5-6) (2006)
Gianluca Boselli, Charvaka Duvvury
Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectron. Reliab. 45 (9-11) (2005)
Jeremy C. Smith, Gianluca Boselli
A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies. Microelectron. Reliab. 45 (2) (2005)
Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper
Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectron. Reliab. 41 (3) (2001)