Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies.
Gianluca BoselliCharvaka DuvvuryPublished in: Microelectron. Reliab. (2005)
Keyphrases
- power consumption
- low power
- future trends
- emerging trends
- design principles
- ubiquitous and pervasive
- nm technology
- emerging technologies
- high speed
- lessons learned
- key issues
- flip flops
- low cost
- open issues
- vlsi circuits
- real world
- data mining
- silicon on insulator
- advanced technologies
- technical solutions
- single chip
- practical experiences
- paradigm shift