Charvaka Duvvury

Publication Activity (10 Years)

Years Active: 1993-2015
Publications (10 Years): 0

Top Topics

Design Methodology

Query Processing

Top Venues

Microelectron. Reliab.

Publications

Harald Gossner, Charvaka Duvvury
System efficient ESD design. Microelectron. Reliab. 55 (12) (2015)
Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer
Circuit design issues in multi-gate FET CMOS technologies. ISSCC (2006)
Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46 (5-6) (2006)
Gianluca Boselli, Charvaka Duvvury
Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectron. Reliab. 45 (9-11) (2005)
Jorge Salcedo-Suñer, Charvaka Duvvury, Roger Cline, Alfonso Cadena-Hernandez
Latchup in voltage tolerant circuits: a new phenomenon. Microelectron. Reliab. 44 (4) (2004)
Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline, Rith Pok
Development of substrate-pumped nMOS protection for a 0.13 mum technology. Microelectron. Reliab. 42 (6) (2002)
Charvaka Duvvury
Issues in Deep Submicron State-of-the-Art ESD Design (Tutorial Abstract). ISQED (2002)
Charvaka Duvvury
Issues in Deep Submicron State-of-the-Art ESD Design. ISQED (2001)
Charvaka Duvvury
ESD protection device issues for IC designs. CICC (2001)
Steven H. Voldman, W. Anderson, R. Ashton, M. Chaine, Charvaka Duvvury, T. Maloney, E. Worley
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectron. Reliab. 41 (3) (2001)
Charvaka Duvvury
ESD: Design For IC Chip Quality and Reliability. ISQED (2000)
Carlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury
Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13 (4) (1994)
Carlos H. Díaz, Charvaka Duvvury, Sung-Mo Kang
Thermal Failure Simulation for Electrical Overstress in Semiconductor Devices. ISCAS (1993)
Charvaka Duvvury, Ajith Amerasekera
ESD: a pervasive reliability concern for IC technologies. Proc. IEEE 81 (5) (1993)