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Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices.
Carlos H. Díaz
Sung-Mo Kang
Charvaka Duvvury
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
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low voltage
electronic circuits
input output
high speed
simulation model
power electronics
circuit design
root cause
chip design
short circuit