Roger Cline

Publication Activity (10 Years)

Years Active: 2002-2006
Publications (10 Years): 0

Publications

Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46 (5-6) (2006)
Jorge Salcedo-Suñer, Charvaka Duvvury, Roger Cline, Alfonso Cadena-Hernandez
Latchup in voltage tolerant circuits: a new phenomenon. Microelectron. Reliab. 44 (4) (2004)
Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline, Rith Pok
Development of substrate-pumped nMOS protection for a 0.13 mum technology. Microelectron. Reliab. 42 (6) (2002)