Hans Kunz

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46 (5-6) (2006)