Nagothu Karmel Kranthi

Publication Activity (10 Years)

Years Active: 2018-2023
Publications (10 Years): 10

Top Topics

Scalability Issues

Top Venues

Publications

Nagothu Karmel Kranthi, Yang Xiu, Yang Xiao, Rajkumar Sankaralingam
Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline. IRPS (2023)
M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. IRPS (2023)
M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. IRPS (2022)
Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. IRPS (2020)
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS (2020)
Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. IRPS (2019)
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. IRPS (2019)
Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. IRPS (2019)
Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS (2018)
Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. VLSI Design (2018)