Login / Signup
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.
Nagothu Karmel Kranthi
Boeila Sampath Kumar
Akram A. Salman
Gianluca Boselli
Mayank Shrivastava
Published in:
IRPS (2020)
Keyphrases
</>
scalability issues
high voltage
power consumption
video sequences
expert systems