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Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.

Nagothu Karmel KranthiBoeila Sampath KumarAkram A. SalmanGianluca BoselliMayank Shrivastava
Published in: IRPS (2020)
Keyphrases
  • scalability issues
  • high voltage
  • power consumption
  • video sequences
  • expert systems