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Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.

Nagothu Karmel KranthiBoeila Sampath KumarAkram A. SalmanGianluca BoselliMayank Shrivastava
Published in: IRPS (2019)
Keyphrases
  • real time
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  • fault tolerance
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  • highly scalable
  • power distribution