Login / Signup

TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection.

Laura ZunarelliLuigi BalestraSusanna ReggianiRaj SankaralingamMariano DissegnaGianluca Boselli
Published in: IRPS (2023)
Keyphrases
  • neural network
  • empirical studies
  • artificial neural networks
  • statistical analysis
  • data sets
  • decision trees
  • database systems
  • information technology
  • simulation study