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Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.
Martin Streibl
Kai Esmark
A. Sieck
Wolfgang Stadler
M. Wendel
J. Szatkowski
Harald Gossner
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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data mining
positive and negative
data sets
neural network
decision making
learning systems
emerging technologies
database
information retrieval
information systems
information technology
information security
st century
high density
intellectual property rights