Erich Gornik

Publication Activity (10 Years)

Years Active: 2001-2011
Publications (10 Years): 0

Publications

Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectron. Reliab. 51 (9-11) (2011)
A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. Microelectron. Reliab. 50 (9-11) (2010)
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49 (9-11) (2009)
Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectron. Reliab. 49 (12) (2009)
Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. Microelectron. Reliab. 47 (9-11) (2007)
Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectron. Reliab. 46 (9-11) (2006)
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45 (9-11) (2005)
Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. IEEE Trans. Instrum. Meas. 54 (6) (2005)
Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. Microelectron. Reliab. 44 (9-11) (2004)
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44 (9-11) (2004)
M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectron. Reliab. 43 (4) (2003)
Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectron. Reliab. 43 (9-11) (2003)
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectron. Reliab. 42 (9-11) (2002)
Dionyz Pogany, Ján Kuzmík, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectron. Reliab. 42 (9-11) (2002)
M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. Microelectron. Reliab. 42 (9-11) (2002)
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectron. Reliab. 41 (9-10) (2001)
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectron. Reliab. 41 (9-10) (2001)