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Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.

Sergey BychikhinMartin LitzenbergerR. PichlerDionyz PoganyErich GornikGerhard GroosMatthias Stecher
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • image analysis
  • multiscale
  • statistical analysis
  • quantitative analysis
  • neural network
  • data mining
  • image reconstruction
  • fourier transform