Matthias Stecher

Publication Activity (10 Years)

Years Active: 2001-2015
Publications (10 Years): 0

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Publications

Julie Paye, Albert Claudi, Matthias Stecher
High voltage robustness of mold compounds under different environmental conditions. IRPS (2015)
Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher
On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). Microelectron. Reliab. 51 (8) (2011)
A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. Microelectron. Reliab. 50 (9-11) (2010)
Harald Gossner, Werner Simbürger, Matthias Stecher
System ESD robustness by co-design of on-chip and on-board protection measures. Microelectron. Reliab. 50 (9-11) (2010)
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49 (9-11) (2009)
Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, Harald Preu, Matthias Stecher
Modeling and characterization of molding compound properties during cure. Microelectron. Reliab. 49 (8) (2009)
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45 (9-11) (2005)
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44 (9-11) (2004)
M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectron. Reliab. 43 (4) (2003)
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectron. Reliab. 41 (9-10) (2001)
Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectron. Reliab. 41 (3) (2001)