Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Georg HaberfehlnerSergey BychikhinViktor DubecMichael HeerA. PodgaynayaM. PfostMatthias StecherErich GornikDionyz PoganyPublished in: Microelectron. Reliab. (2009)