Michael Heer

Publication Activity (10 Years)

Years Active: 2004-2015
Publications (10 Years): 1

Top Topics

Radio Frequency

Top Venues

Microelectron. Reliab.

Publications

Matteo Rigato, Clément Fleury, Michael Heer, Mattia Capriotti, Werner Simbürger, Dionyz Pogany
ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique. Microelectron. Reliab. 55 (9-10) (2015)
Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectron. Reliab. 51 (9-11) (2011)
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49 (9-11) (2009)
Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectron. Reliab. 49 (12) (2009)
Michael Heer, P. Grombach, A. Heid, Dionyz Pogany
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. Microelectron. Reliab. 48 (8-9) (2008)
Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, B. Ramler
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. Microelectron. Reliab. 47 (9-11) (2007)
Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectron. Reliab. 46 (9-11) (2006)
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45 (9-11) (2005)
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44 (9-11) (2004)