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Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications.

Michael HeerP. GrombachA. HeidDionyz Pogany
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • hot spots
  • markov chain
  • statistical analysis
  • infrared
  • machine learning
  • information extraction
  • sensor networks
  • text mining
  • business intelligence
  • social network analysis