Application of transient interferometric mapping method for ESD and latch-up analysis.
Dionyz PoganySergey BychikhinMichael HeerW. MamaneeErich GornikPublished in: Microelectron. Reliab. (2011)
Keyphrases
- pairwise
- high accuracy
- objective function
- experimental evaluation
- image processing
- optimization algorithm
- significant improvement
- cost function
- dynamic programming
- edge detection
- statistical analysis
- computationally efficient
- mapping function
- artificial neural networks
- high precision
- classification method
- frequency domain
- synthetic data
- learning algorithm
- support vector machine svm
- theoretical analysis
- computational complexity
- denoising
- data analysis
- preprocessing
- prior knowledge
- k means