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ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique.
Matteo Rigato
Clément Fleury
Michael Heer
Mattia Capriotti
Werner Simbürger
Dionyz Pogany
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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image reconstruction
steady state
radio frequency
relevance feedback
power consumption
high density
denoising
information systems
case study
least squares
synthetic aperture radar
sar imagery