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ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique.

Matteo RigatoClément FleuryMichael HeerMattia CapriottiWerner SimbürgerDionyz Pogany
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • image reconstruction
  • steady state
  • radio frequency
  • relevance feedback
  • power consumption
  • high density
  • denoising
  • information systems
  • case study
  • least squares
  • synthetic aperture radar
  • sar imagery