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Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.

Michael HeerSergey BychikhinW. MamaneeDionyz PoganyA. HeidP. GrombachM. KlaussnerWinfried SoppaB. Ramler
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • numerical analysis
  • low voltage
  • image enhancement
  • design considerations
  • real time
  • mobile devices
  • context aware
  • parallel processing