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On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP).
Martin Sauter
Werner Simbürger
David Johnsson
Matthias Stecher
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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transmission line
tunnel diode
power system
wave propagation
network reliability
differential equations
semiconductor manufacturing
dynamic characteristics
image analysis
magnetic field
electrical power
reinforcement learning
test data
operating conditions
room temperature