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Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.

A. PodgaynayaRalf RudolfB. ElattariDionyz PoganyErich GornikMatthias StecherMarc Strasser
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • failure modes
  • fault tree
  • communication channels
  • image quality
  • computer simulation
  • energy consumption
  • content analysis
  • energy efficiency
  • thin film
  • ultra wideband