System ESD robustness by co-design of on-chip and on-board protection measures.

Harald Gossner Werner Simbürger Matthias Stecher

Published in: Microelectron. Reliab. (2010)

Keyphrases

high speed
low cost
fault diagnosis
neural network
quantitative measures
computational efficiency
information retrieval
genetic algorithm
information systems
quality measures
integrated circuit
privacy protection
contingency tables
single chip
programmable logic