Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Dionyz PoganyJán KuzmíkJ. DarmoMartin LitzenbergerSergey BychikhinKarl UnterrainerZ. MozolovaS. HascikTibor LalinskyErich GornikPublished in: Microelectron. Reliab. (2002)
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