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Maximilian W. Feil
ORCID
Publication Activity (10 Years)
Years Active: 2021-2023
Publications (10 Years): 3
Top Topics
Parameter Adjustment
Low Voltage
Estimation Process
Silicon Dioxide
Top Venues
IRPS
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Publications
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Maximilian W. Feil
,
Katja Waschneck
,
Hans Reisinger
,
Judith Berens
,
Thomas Aichinger
,
Paul Salmen
,
Gerald Rescher
,
Wolfgang Gustin
,
Tibor Grasser
Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs.
IRPS
(2023)
Maximilian W. Feil
,
Hans Reisinger
,
André Kabakow
,
Thomas Aichinger
,
Wolfgang Gustin
,
Tibor Grasser
Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs.
IRPS
(2022)
Paul Salmen
,
Maximilian W. Feil
,
Katja Waschneck
,
Hans Reisinger
,
Gerald Rescher
,
Thomas Aichinger
A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation.
IRPS
(2021)