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A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation.
Paul Salmen
Maximilian W. Feil
Katja Waschneck
Hans Reisinger
Gerald Rescher
Thomas Aichinger
Published in:
IRPS (2021)
Keyphrases
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low voltage
stability analysis
hypothesis test
parameter space
parameter adjustment
real time
data sets
information systems
test cases
parameter values
parameter settings
search procedure
robust estimation
accurate estimation
estimation process