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Olaf Wittler
Publication Activity (10 Years)
Years Active: 2011-2017
Publications (10 Years): 3
Top Topics
Mechanical Properties
Multiscale
Process Control
Stainless Steel
Top Venues
Microelectron. Reliab.
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Publications
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A. Middendorf
,
A. Grams
,
S. Janzen
,
Klaus-Dieter Lang
,
Olaf Wittler
Laser cuts increase the reliability of heavy-wire bonds and enable on-line process control using thermography.
Microelectron. Reliab.
(2017)
Marian Sebastian Broll
,
Ute Geissler
,
Jan Höfer
,
Stefan Schmitz
,
Olaf Wittler
,
Klaus-Dieter Lang
Microstructural evolution of ultrasonic-bonded aluminum wires.
Microelectron. Reliab.
55 (6) (2015)
Marian Sebastian Broll
,
Ute Geissler
,
Jan Höfer
,
Stefan Schmitz
,
Olaf Wittler
,
Martin Schneider-Ramelow
,
Klaus-Dieter Lang
Correlation between mechanical properties and microstructure of different aluminum wire qualities after ultrasonic bonding.
Microelectron. Reliab.
55 (9-10) (2015)
Saskia Huber
,
Marius van Dijk
,
Hans Walter
,
Olaf Wittler
,
Tina Thomas
,
Klaus-Dieter Lang
Improving the FE simulation of molded packages using warpage measurements.
Microelectron. Reliab.
54 (9-10) (2014)
O. Hölck
,
Jörg Bauer
,
Tanja Braun
,
Hans Walter
,
Olaf Wittler
,
Bernhard Wunderle
,
Klaus-Dieter Lang
interfaces investigated by molecular modeling.
Microelectron. Reliab.
53 (8) (2013)
O. Hölck
,
Jörg Bauer
,
Olaf Wittler
,
Bernd Michel
,
Bernhard Wunderle
Comparative characterization of chip to epoxy interfaces by molecular modeling and contact angle determination.
Microelectron. Reliab.
52 (7) (2012)
Reinhard Pufall
,
Michael Goroll
,
Joachim Mahler
,
Werner Kanert
,
M. Bouazza
,
Olaf Wittler
,
Rainer Dudek
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests.
Microelectron. Reliab.
52 (7) (2012)
Lukasz Dowhan
,
Artur Wymyslowski
,
Pawel Janus
,
Magdalena Ekwinska
,
Olaf Wittler
Extraction of elastic-plastic material properties of thin films through nanoindentaion technique with support of numerical methods.
Microelectron. Reliab.
51 (6) (2011)