GREY SCALE
Experts
- Daniel Sánchez
- Jesús Chamorro-Martínez
- Belén Prados-Suárez
- Ján Morovic
- Neal R. Harvey
- Pei-Li Sun
- Christine Fernandez-Maloigne
- Jesús Angulo
- Ammar Belatreche
- Liam P. Maguire
- T. Martin McGinnity
- Stephen Marshall
- Elena Galán-Perales
- Anne Marie Svane
- Michel Jourlin
- Mihai Ivanovici
- Michael Breuß
- Bart J. Westgeest
- Stefan Schulte
- Sergio De Agostino
- Adrian N. Evans
- Guillaume Noyel
- Rémi Kouassi
- Noël Richard
- Henryk Palus
- Liam McDaid
- Franco Liberati
- Jean Serra
- Fernando Torres Medina
- Graham D. Finlayson
- Valery V. Starovoitov
- Luigi Cinque
- Alan L. Harvey
- Dietrich Van der Weken
- Sheikh Tania
- Eva Dokládalová
- Valérie De Witte
- M. Manzur Murshed
- Mike Nachtegael
Venues
- Image Vis. Comput.
- IET Image Process.
- CoRR
- CGIV
- EUSIPCO
- Pattern Recognit. Lett.
- ISMM
- Multim. Tools Appl.
- Pattern Anal. Appl.
- Color Imaging Conference
- FUZZ-IEEE
- J. Math. Imaging Vis.
- SSPR/SPR
- Pattern Recognit.
- BMVC
- ICIP (1)
- IVCNZ
- ICPR
- Appl. Soft Comput.
- Medical Biol. Eng. Comput.
- Int. J. Comput. Vis.
- VISAPP (1)
- ICDIP
- SSVM
- Int. J. Multim. Intell. Secur.
- ICASSP
- SITIS
- Signal Process.
- Microprocess. Microsystems
- CAIP
- ICIP
- IJCNN
- Comput. Vis. Image Underst.
- Fundam. Informaticae
- EvoWorkshops
- Expert Syst. Appl.
- Signal Process. Image Commun.
- ISITA
- Microelectron. Reliab.
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