GREY SCALE
Experts
- Jesús Chamorro-Martínez
- Belén Prados-Suárez
- Daniel Sánchez
- Anne Marie Svane
- Ammar Belatreche
- Jesús Angulo
- Neal R. Harvey
- Elena Galán-Perales
- Pei-Li Sun
- Ján Morovic
- Liam P. Maguire
- Stephen Marshall
- Christine Fernandez-Maloigne
- T. Martin McGinnity
- Mihai Ivanovici
- Francisco Ortiz
- Henryk Palus
- Michael Breuß
- M. Manzur Murshed
- Rémi Kouassi
- Graham D. Finlayson
- Franco Liberati
- Diego Oliva
- Fernando Torres Medina
- Shyh Wei Teng
- Huaijun Qiu
- Eva Dokládalová
- Edwin R. Hancock
- Piero Zamperoni
- Etienne E. Kerre
- Bart J. Westgeest
- Gour C. Karmakar
- Noël Richard
- Guillaume Noyel
- Adrian N. Evans
- Mike Nachtegael
- Valery V. Starovoitov
- Luigi Cinque
- Sheikh Tania
Venues
- Image Vis. Comput.
- CGIV
- CoRR
- IET Image Process.
- EUSIPCO
- Pattern Recognit. Lett.
- ISMM
- Pattern Anal. Appl.
- Multim. Tools Appl.
- SSPR/SPR
- J. Math. Imaging Vis.
- BMVC
- ICPR
- ICIP (1)
- Color Imaging Conference
- Pattern Recognit.
- FUZZ-IEEE
- IVCNZ
- SITIS
- ICIP
- Int. J. Multim. Intell. Secur.
- Fundam. Informaticae
- VISAPP (1)
- CAIP
- Int. J. Comput. Vis.
- Medical Biol. Eng. Comput.
- Comput. Vis. Image Underst.
- ICDIP
- Signal Process.
- Microprocess. Microsystems
- IJCNN
- ICASSP
- SSVM
- Appl. Soft Comput.
- ICMCS
- ICONIP (6)
- IPCV
- Microelectron. Reliab.
- DSP
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