Luc De Schepper

Publication Activity (10 Years)

Years Active: 2001-2008
Publications (10 Years): 0

Publications

Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectron. Reliab. 48 (8-9) (2008)
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43 (9-11) (2003)
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42 (9-11) (2002)
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
at ultra low voltages. Microelectron. Reliab. 42 (9-11) (2002)
R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectron. Reliab. 42 (9-11) (2002)
Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41 (9-10) (2001)
R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41 (3) (2001)
R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. Microelectron. Reliab. 41 (9-10) (2001)