Statistical aspects of the degradation of LDD nMOSFETs.
E. AndriesR. DreesenKris CroesWard De CeuninckLuc De SchepperGuido GroesenekenK. F. LoMarc D'OlieslaegerJan D'HaenPublished in: Microelectron. Reliab. (2002)
Keyphrases
- real time
- statistical measures
- statistical information
- information theoretic
- image restoration
- statistical analysis
- data driven
- hidden markov models
- object recognition
- image processing
- neural network
- multiresolution
- user interface
- mutual information
- case study
- statistical models
- social networks
- information theory
- statistical data
- degraded images
- database