R. Dreesen

Publication Activity (10 Years)

Years Active: 2001-2003
Publications (10 Years): 0

Publications

Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43 (9-11) (2003)
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42 (9-11) (2002)
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
at ultra low voltages. Microelectron. Reliab. 42 (9-11) (2002)
Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41 (9-10) (2001)
R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41 (3) (2001)